EVIDENT 奥林巴斯 BX53-P 偏光显微镜
  • EVIDENT 奥林巴斯 BX53-P 偏光显微镜

EVIDENT 奥林巴斯 BX53-P 偏光显微镜

EVIDENT 奥林巴斯 BX53-P 偏光显微镜

EVIDENT      奥林巴斯      BX53-P       偏光显微镜

偏振光观察的新标准

奥林巴斯 BX53-P 偏光显微镜采用 UIS2 无限远校正光学系统和独特的光学设计，在偏光应用中具有出色的性能。扩展的兼容补偿器系列使 BX53-P 显微镜用途广泛，几乎可以处理任何领域的观察和测量应用。

UIS2 Optics Provide Outstanding Expandability

Maximizing the advantages of infinity correction, the UIS2 optical system helps prevent the deterioration of optical microscope performance and eliminates magnification factors, even when polarizing elements, like analyzers, tint plates, or compensators, are introduced into the light path. The BX53-P microscope also accepts intermediate attachments available for BX3 series microscopes, as well as cameras and imaging systems.

UIS2 Optics Provide Outstanding Expandability

Zonal structure of Plagioclase in quartz diorite. *Scales Indicate actual size of samples

UIS2 Optics Provide Outstanding Expandability

Optical texture of MBBA  *Scales Indicate actual size of samples

Bertrand Lens for Conoscopic and Orthoscopic Observations

Bertrand Lens for Conoscopic and Orthoscopic Observations

With a conoscopic observation attachment, switching between orthoscopic and conoscopic observation is simple. It is focusable for viewing of clear back focal plane interference patterns. The Bertrand lens is focusable for clear viewing back focal plane interference patterns. The  field stop makes it possible to consistently obtain sharp conoscopic images.

An Extensive Range of Compensators and Wave Plates

Six different compensators are available for measurements of birefringence in rock and mineral thin sections. Measurement retardation level ranges from 0 to 20λ. For easier measurement and high image contrast, Berek and Senarmont
compensators can be used, which change the retardation level in the entire field of view.

An Extensive Range of Compensators and Wave Plates

MEASURING RANGE OF COMPENSATORS
CompensatorMeasurement RangeApplications
Thick Berek
(U-CTB)		0–11000 nm
(20λ)		Measurement of high retardation level (R*>3λ), (crystals, macromolecules,fi ber, etc.)
Berek
(U-CBE)		0–1640 nm
(3λ)		Measurement of retardation level (crystals,macromolecules, living organisms, etc.)
Senarmont
Compensator
(U-CSE)		0–546 nm
(1λ)		Measurement of retardation level (crystals, living organisms, etc.);
enhancement of image contrast (living organisms,etc.)
Brace-Koehler
Compensator1/10λ
(U-CBR1)		0–55 nm
(1/10λ)		Measurement of low retardation level (living organisms, etc.)
Brace-Koehler
Compensator1/30λ
(U-CBE2)		0–20 nm
(1/30λ)		Measurement of image contrast (living organisms,etc.)
Quartz Wedge
(U-CWE2)		500–2200 nm
(4λ)		Approximate measurement of retardation level (crystal, macromolecules, etc.)
*R = retardation level
For more accurate measurement, we recommend that compensators (except U-CWE2) be used together with the interference fi lter 45-IF546

Minimal Strain Optics

Minimal Strain Optics

Our polarized light objectives reduce internal strain to a minimum. This means a higher EF value, resulting in excellent image contrast.

Robust and Accurate Rotating Stage

The rotating-centering mechanism attached to the rotary stage  enables smooth rotation of a specimen. In addition, there is a click-stop mechanism at each 45 degrees for precise measurement. With the optional dual-mechanical stage, discreet X-Y movement is possible.

Dual-mechanical Stage

Dual-mechanical Stage

观察方法明场
✓

偏光
✓

简易偏光
✓
聚焦聚焦机制载物台聚焦✓
载物台机械式精密可旋转式载物台
  • 旋转角度：360度
聚光镜手动偏光聚光镜NA 0.9 / WD 1.3毫米（载玻片1.5毫米）（4X-100X）
观察筒宽视场(FN 22)三目观察筒✓


倾斜式三目观察筒✓
尺寸（宽×深×高）

274 (W) x 436 (D) x 535 (H) mm
重量

16 kg

手机/微信：13242449659电话：0755-89355351 QQ：842471885 邮箱：842471885@qq.com

本站使用百度智能门户搭建 管理登录
粤ICP备12090481号
在线客服